Zenari, M.
~ 0  Ergebnisse:
Personensuche X
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1

Addressing the electrical degradation of 845 nm micro-trans..:

, In: 2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD),
Zenari, M. ; Buffolo, M. ; De Santi, C.... - p. 91-92 , 2023
 
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2

Impact of a defect trapping layer on the reliability of 1.3..:

Zenari, M. ; Buffolo, M. ; De Santi, C....
Microelectronics Reliability.  138 (2022)  - p. 114714 , 2022
 
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3

Origin of the Diffusion-Related Optical Degradation of 1.3 ..:

Buffolo, Matteo ; Lain, Federico ; Zenari, M....
IEEE Journal of Selected Topics in Quantum Electronics.  28 (2022)  1: Semiconductor Lasers - p. 1-9 , 2022
 
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4

Degradation mechanisms of 1.3 μm C-doped quantum dot lasers..:

Zenari, M. ; Buffolo, M. ; De Santi, C....
Microelectronics Reliability.  126 (2021)  - p. 114222 , 2021
 
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6

A multi-element psychosocial intervention for early psychos..:

Ruggeri, M ; Bonetto, C ; Lasalvia, A...
https://discovery.ucl.ac.uk/id/eprint/1372866/1/1745-6215-13-73.pdf.  , 2012
 
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10

Evidence of left atrial remodeling and left ventricular dia..:

Zoppini, G. ; Bonapace, S. ; Bergamini, C....
Nutrition, Metabolism and Cardiovascular Diseases.  26 (2016)  11 - p. 1026-1032 , 2016
 
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