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Zerarka, M
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1

New reliability model for power SiC MOSFET technologies und..:

Zerarka, M. ; Rustichelli, V. ; Perrotin, O....
Microelectronics Reliability.  150 (2023)  - p. 115190 , 2023
Link: https://doi.org/10.1016/..
 
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2

Laser-induced Transients in a GaN-on-Si Power HEMT using Si..:

, In: 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Ngom, C. ; Pouget, V. ; Zerarka, M.... - p. 1-6 , 2021
Link: https://doi.org/10.1109/..
 
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3

Modelling of charge injection by multi-photon absorption in..:

Ngom, C. ; Pouget, V. ; Zerarka, M....
Microelectronics Reliability.  126 (2021)  - p. 114339 , 2021
Link: https://doi.org/10.1016/..
 
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4

Cosmic ray immunity of COTS Normally-Off Power GaN FETs for..:

, In: 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Zerarka, M. ; Crepel, O. ; Weulersse, C.... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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5

Radiation robustness of normally-off GaN/HEMT power transis..:

Zerarka, M. ; Crepel, O.
Microelectronics Reliability.  88-90 (2018)  - p. 984-991 , 2018
Link: https://doi.org/10.1016/..
 
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6

Optimization of a MOS–IGBT–SCR ESD protection component in ..:

Arbess, H. ; Bafleur, M. ; Trémouilles, D..
Microelectronics Reliability.  55 (2015)  9-10 - p. 1476-1480 , 2015
Link: https://doi.org/10.1016/..
 
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7

A methodologic project to characterize and model COTS compo..:

Durier, A. ; Bensoussan, A. ; Zerarka, M....
Microelectronics Reliability.  55 (2015)  9-10 - p. 2097-2102 , 2015
Link: https://doi.org/10.1016/..
 
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8

Comparative study of sensitive volume and triggering criter..:

Zerarka, M. ; Austin, P. ; Bafleur, M.
Microelectronics Reliability.  51 (2011)  9-11 - p. 1990-1994 , 2011
Link: https://doi.org/10.1016/..
 
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9

List of Authors:

, In: Building Wireless Sensor Networks,
Aschheim, Raymond ; Benakila, Mohamed Ikbal ; Bindel, Sébastien... - p. 171 , 2017
Link: https://doi.org/10.1016/..
 
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10

One-by-One Embedding of the Twisted Hypercube into Pancake ..:

, In: Building Wireless Sensor Networks,
Femmam, Smain ; Zerarka, Faouzi M. - p. 145-169 , 2017
Link: https://doi.org/10.1016/..
 
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11

Modelling of charge injection by multi-photon absorption in..:

Ngom, C ; Pouget, Vincent ; Zerarka, M...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114339.  , 2021
Link: https://hal.science/hal-..
 
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12

Backside Laser Testing of Single-Event Effects in GaN-on-Si..:

Ngom, C ; Pouget, Vincent ; Zerarka, M...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2021.3081485.  , 2021
Link: https://hal.archives-ouv..
 
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13

Backside Laser Testing of Single-Event Effects in GaN-on-Si..:

Ngom, C ; Pouget, Vincent ; Zerarka, M...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2021.3081485.  , 2021
Link: https://hal.science/hal-..
 
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14

Modelling of charge injection by multi-photon absorption in..:

Ngom, C ; Pouget, Vincent ; Zerarka, M...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114339.  , 2021
Link: https://hal.science/hal-..
 
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15

ONE BY ONE EMBEDDING THE CROSSED HYPERCUBE INTO PANCAKE GRA..:

ZERARKA, M.F
https://revues.univ-biskra.dz/index.php/cds/article/view/1920/1727.  , 2017
Link: https://revues.univ-bisk..
 
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