Zhang, Fangxing
294  Ergebnisse:
Personensuche X
?
1

A Physics-Oriented Model of Cryogenic MOSFETs including the..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Zhang, Xinyue ; Zhang, Fangxing ; Wang, Zirui... - p. 1-3 , 2024
 
?
2

Capacitance Modeling With Charge Partitions Covering Full-R..:

Zhang, Fangxing ; Dai, Wu ; Wang, Kaifeng...
IEEE Transactions on Electron Devices.  71 (2024)  7 - p. 4373-4380 , 2024
 
?
3

A Surface Potential Based Full-Region Current Model for Dop..:

Zhang, Fangxing ; Li, Hao ; Wang, Kaifeng...
IEEE Transactions on Electron Devices.  71 (2024)  1 - p. 46-53 , 2024
 
?
5

First Foundry Platform Demonstration of Hybrid Tunnel FET a..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),
Wang, Kaifeng ; Wu, Yongqin ; Ren, Ye... - p. 13-16 , 2023
 
?
6

Metal–Ferroelectric–Semiconductor Tunnel Junction: Essentia..:

Feng, Ning ; Li, Hao ; Peng, Baokang...
IEEE Transactions on Electron Devices.  70 (2023)  6 - p. 3382-3389 , 2023
 
?
7

A Compact Model of FTJ Covering the Trapping/De-trapping Ch..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Feng, Ning ; Ji, Ning ; Zhang, Fangxing... - p. 121-124 , 2023
 
?
8

A Novel TFET-MOSFET Hybrid SRAM for Ultra-Low-Power Applica..:

, In: 2023 IEEE 15th International Conference on ASIC (ASICON),
Wei, Renjie ; Wang, Kaifeng ; Wang, Zhixuan... - p. 1-4 , 2023
 
?
9

Stable Packaging Method of Ultrahigh-Q Microcavity General ..:

, In: 2022 Asia Communications and Photonics Conference (ACP),
Zhang, Fangxing ; Sun, Jialve ; HuangFu, Shengnan - p. 2114-2116 , 2022
 
?
11

Robustness of Ultrahigh-Q Microcavity General Packaged Devi..:

, In: 2022 Asia Communications and Photonics Conference (ACP),
HuangFu, Shengnan ; Zhang, Fangxing ; Sun, Jialve - p. 2132-2134 , 2022
 
?
12

Single-cell transcriptomics reveals cell type diversity of ..:

Chen, Yang ; Zhang, Peng ; Liao, Jinling...
Journal of Genetics and Genomics.  49 (2022)  11 - p. 1002-1015 , 2022
 
?
13

Investigation of the temperature dependence of Bulk-Si TFET..:

, In: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Zhang, Fangxing ; Cong, Shen ; Wang, Kaifeng.. - p. 1-3 , 2022
 
?
15

An Automatic Integration Network Approach for Generic Devic..:

, In: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Dai, Wu ; Zhang, Fangxing ; Wang, Kaifeng... - p. 1-3 , 2022
 
1-15