Zhao, Youwen
388  Ergebnisse:
Personensuche X
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1

Epitaxial hillocks defects caused by subsurface damage from..:

Liu, Lijie ; Zhao, Youwen ; Huang, Yong...
Microelectronics Reliability.  156 (2024)  - p. 115376 , 2024
 
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3

Evaluation of polishing induced subsurface damage in InAs s..:

Feng, Yinhong ; Shen, Guiying ; Zhao, Youwen...
Materials Science in Semiconductor Processing.  167 (2023)  - p. 107770 , 2023
 
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4

Relation extraction: advancements through deep learning and..:

Zhao, Youwen ; Yuan, Xiangbo ; Yuan, Ye..
Social Network Analysis and Mining.  13 (2023)  1 - p. , 2023
 
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6

Investigation of Comet-Shaped Defects in an EPI-InP Layer G..:

Liu, Lijie ; Zhao, Youwen ; Liu, Jingming...
Journal of Electronic Materials.  52 (2023)  8 - p. 5047-5052 , 2023
 
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7

The measurement of responsivity of infrared photodetectors ..:

Li, Nong ; Jiang, Dongwei ; Wang, Guowei...
Journal of Semiconductors.  44 (2023)  10 - p. 102301 , 2023
 
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9

An EEG annotation system facilitating brain disease researc:

, In: 2023 16th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics (CISP-BMEI),
Zhao, Youwen ; Lin, Zhixiong ; Wang, Chenghua.. - p. 1-6 , 2023
 
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11

Residual stress distribution and flatness of dislocation-fr..:

Zhou, Yuan ; Zhao, Youwen ; Xie, Hui...
Japanese Journal of Applied Physics.  60 (2021)  3 - p. 035510 , 2021
 
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12

Evaluation of residual stress in InP and InAs (100) substra..:

Zhou, Yuan ; Zhao, Youwen ; Shen, Guiying...
Materials Science in Semiconductor Processing.  121 (2021)  - p. 105460 , 2021
 
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13

Evaluation of LEC and VGF-InAs substrates through surface d..:

Liu, Lijie ; Zhao, Youwen ; Huang, Yong...
Materials Science in Semiconductor Processing.  125 (2021)  - p. 105624 , 2021
 
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14

Representative POCT Products:

, In: In Vitro Diagnostic Industry in China,
Chen, Lili ; Wang, Ying ; Guo, Hairong.. - p. 175-189 , 2021
 
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