E-LIB Suche - Ergebnisse für: Zheleva, Tsvetanka

1

Electron beam-induced crystallization of Al2O3 gate layer o..:

Klingshirn, Christopher J. ; Jayawardena, Asanka ; Dhar, Sarit...
Micron. 140 (2021) - p. 102954 , 2021

Link: https://doi.org/10.1016/..

2

Analytical electron microscopy of (2¯01) β-Ga2O3/SiO2 and (..:

Klingshirn, Christopher J. ; Jayawardena, Asanka ; Dhar, Sarit...
Journal of Applied Physics. 129 (2021) 19 - p. , 2021

Link: https://doi.org/10.1063/..

3

Characterization of the Oxide-Semiconductor Interface in 4H..:

Taillon, Joshua ; Gaskell, Karen ; Liu, Gang...
Microscopy and Microanalysis. 21 (2015) S3 - p. 1537-1538 , 2015

Link: https://doi.org/10.1017/..

4

Role of stress voltage on structural degradation of GaN hig..:

Joh, Jungwoo ; Alamo, Jesús A. del ; Langworthy, Kurt..
Microelectronics Reliability. 51 (2011) 2 - p. 201-206 , 2011

Link: https://doi.org/10.1016/..

5

Transition layers at the SiO2∕SiC interface:

Zheleva, Tsvetanka ; Lelis, Aivars ; Duscher, Gerd...
Applied Physics Letters. 93 (2008) 2 - p. , 2008

Link: https://doi.org/10.1063/..

6

Analytical and Structural Investigations of the Metal-Enhan..:

Lee, Unchul ; Zheleva, Tsvetanka ; Lelis, Aivars...
ECS Transactions. 13 (2008) 3 - p. 99-109 , 2008

Link: https://doi.org/10.1149/..

7

Characterization of the origin of band states in the SiC/Si..:

, In: 2007 International Semiconductor Device Research Symposium,

Biggerstaff, Trinity L. ; McClellan, Ryan D. ; Lelis, Aivars... - p. None , 2007

Link: https://doi.org/10.1109/..

8

Pressure response of the ultraviolet photoluminescence of Z..:

Huso, Jesse ; Morrison, John L. ; Hoeck, Heather...
Applied Physics Letters. 89 (2006) 17 - p. , 2006

Link: https://doi.org/10.1063/..

9

The formation of crystalline defects and crystal growth mec..:

Kawaguchi, Yasutoshi ; Shimizu, Masaya ; Yamaguchi, Masahito...
Journal of Crystal Growth. 189-190 (1998) - p. 24-28 , 1998

Link: https://doi.org/10.1016/..

10

Sublimation growth and characterization of bulk aluminum ni..:

Balkaş, Cengiz M. ; Sitar, Zlatko ; Zheleva, Tsvetanka...
Journal of Crystal Growth. 179 (1997) 3-4 - p. 363-370 , 1997

Link: https://doi.org/10.1016/..

11

Epitaxial growth in large-lattice-mismatch systems:

Zheleva, Tsvetanka ; Jagannadham, K. ; Narayan, J.
Journal of Applied Physics. 75 (1994) 2 - p. 860-871 , 1994

Link: https://doi.org/10.1063/..

12

Analysis of the electronic and chemical structure in boron ..:

Taillon, Joshua A. ; Klingshirn, Christopher J. ; Jiao, Chunkun...
Applied Physics Letters. 113 (2018) 19 - p. , 2018

Link: https://doi.org/10.1063/..

13

Silver nanoplates with ground or metastable structures obta..:

Zhelev, Doncho V. ; Zheleva, Tsvetanka S.
Journal of Applied Physics. 115 (2014) 4 - p. , 2014

Link: https://doi.org/10.1063/..

14

Systematic structural and chemical characterization of the ..:

Taillon, Joshua A. ; Hyuk Yang, Joon ; Ahyi, Claude A....
Journal of Applied Physics. 113 (2013) 4 - p. , 2013

Link: https://doi.org/10.1063/..

15

Deposition factors and band gap of zinc-blende AlN:

Thompson, Margarita P. ; Auner, Gregory W. ; Zheleva, Tsvetanka S....
Journal of Applied Physics. 89 (2001) 6 - p. 3331-3336 , 2001

Link: https://doi.org/10.1063/..