E-LIB Suche - Ergebnisse für: Zheng, Yu-Zhe

1

Performance improvement of Zn0.5Mg0.5O UV sensor by supercr..:

Chien, Ya-Ting ; Tu, Hong-Yi ; Chen, Wen-Chung...
Materials Science in Semiconductor Processing. 158 (2023) - p. 107343 , 2023

Link: https://doi.org/10.1016/..

2

Improving Hot Carrier Reliability of Organic-TFTs by Extend..:

Hung, Wei-Chun ; Lin, Jia-Hong ; Chang, Ting-Chang...
IEEE Electron Device Letters. 44 (2023) 4 - p. 626-629 , 2023

Link: https://doi.org/10.1109/..

3

Investigating DC and AC degradation behaviors to P-type low..:

Chen, Po-Hsun ; Zheng, Yu-Zhe ; Yeh, Tsung-Han.
Journal of Physics D: Applied Physics. 56 (2023) 43 - p. 435101 , 2023

Link: https://doi.org/10.1088/..

4

Analysis of self-heating-related instability in n-channel l..:

Tu, Yu-Fa ; Chang, Ting-Chang ; Zhou, Kuan-Ju...
Applied Physics Express. 15 (2022) 3 - p. 034003 , 2022

Link: https://doi.org/10.35848..

5

Gate Dielectric Leakage Reduction in Hard-Mask Defined and ..:

Chen, Jian-Jie ; Chang, Ting-Chang ; Hung, Yang-Hao...
IEEE Electron Device Letters. 43 (2022) 1 - p. 48-51 , 2022

Link: https://doi.org/10.1109/..

6

Physical Mechanism of the Mechanical Bending of High-Perfor..:

Zheng, Yu-Zhe ; Chen, Yu-An ; Chen, Po-Hsun...
ACS Applied Electronic Materials. 4 (2022) 6 - p. 3000-3009 , 2022

Link: https://doi.org/10.1021/..

7

Abnormal Threshold Voltage Degradation Under Semi-On State ..:

Lin, Jia-Hong ; Ciou, Fong-Min ; Chang, Ting-Chang...
IEEE Electron Device Letters. 43 (2022) 9 - p. 1420-1423 , 2022

Link: https://doi.org/10.1109/..

8

Improving Drain-Induced Barrier Lowering Effect and Hot Car..:

Hung, Yang-Hao ; Chang, Ting-Chang ; Tu, Yu-Fa...
IEEE Electron Device Letters. 43 (2022) 4 - p. 569-572 , 2022

Link: https://doi.org/10.1109/..

9

Improvement of Strained Negative Bias Temperature Instabili..:

Wang, Yu-Xuan ; Chang, Ting-Chang ; Tai, Mao-Chou...
IEEE Transactions on Electron Devices. 69 (2022) 3 - p. 1532-1537 , 2022

Link: https://doi.org/10.1109/..

10

Investigation of the Self-Heating Effect in High Performanc..:

Chen, Yu-An ; Zheng, Yu-Zhe ; Chang, Ting-Chang...
IEEE Electron Device Letters. 43 (2022) 8 - p. 1243-1246 , 2022

Link: https://doi.org/10.1109/..

11

Heterogeneous metal oxide channel structure for ultra-high ..:

Zhou, Kuan-Ju ; Chen, Po-Hsun ; Zheng, Yu-Zhe...
Journal of Materials Chemistry C. 10 (2022) 24 - p. 9192-9197 , 2022

Link: https://doi.org/10.1039/..

12

Suppressing Drain-Induced Barrier Lowering and Kink Effect ..:

Zhou, Kuan-Ju ; Zheng, Yu-Zhe ; Tai, Mao-Chou...
IEEE Electron Device Letters. 43 (2022) 4 - p. 576-579 , 2022

Link: https://doi.org/10.1109/..

13

Abnormal Two-Stage Degradation on P-Type Low-Temperature Po..:

Tu, Hong-Yi ; Chang, Ting-Chang ; Tsao, Yu-Ching...
IEEE Electron Device Letters. 43 (2022) 5 - p. 721-724 , 2022

Link: https://doi.org/10.1109/..

14

Performance Enhancement of InGaZnO Top-Gate Thin Film Trans..:

Chien, Ya-Ting ; Tsai, Yu-Lin ; Zhou, Kuan-Ju...
IEEE Electron Device Letters. 42 (2021) 11 - p. 1611-1614 , 2021

Link: https://doi.org/10.1109/..

15

Abnormal hysteresis formation in hump region after positive..:

Tu, Hong-Yi ; Chang, Ting-Chang ; Tsao, Yu-Ching...
Journal of Physics D: Applied Physics. 53 (2020) 40 - p. 405104 , 2020

Link: https://doi.org/10.1088/..