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2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) ,
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The Impact of Thermal Noise in Multi-Domain Hf-based Antife..:
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2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) ,
3
Effects of Source/Drain Electrodes on Thermal Stability of ..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
9
First Demonstration of Work Function-Engineered BEOL-Compat..:
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2023 International Conference on IC Design and Technology (ICICDT) ,
10
First Demonstration of BEOL-compatible Amorphous InGaZnOx C..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
11
First Study of the Charge Trapping Aggravation Induced by A..:
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2023 International Electron Devices Meeting (IEDM) ,
12
First BEOL-compatible IGZO Ferroelectic-Modulated Diode wit..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
13
First Demonstration of BEOL-Compatible MFMIS Fe-FETs with 3..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
14