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Zimpeck, A.L.
64  Ergebnisse:
Personensuche X
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1

Pros and Cons of ST and SIG FinFET Inverters for Low Power ..:

, In: 2020 IEEE International Symposium on Circuits and Systems (ISCAS),
Moraes, L. B. ; Zimpeck, A. L. ; Meinhardt, C.. - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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2

Circuit design using Schmitt Trigger to reliability improve..:

Zimpeck, A.L. ; Meinhardt, C. ; Artola, L....
Microelectronics Reliability.  114 (2020)  - p. 113754 , 2020
Link: https://doi.org/10.1016/..
 
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3

Minimum Energy FinFET Schmitt Trigger Design Considering Pr..:

, In: 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC),
Moraes, L. B. ; Zimpeck, A. L. ; Meinhardt, C.. - p. 88-93 , 2019
Link: https://doi.org/10.1109/..
 
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4

Exploring Schmitt Trigger Circuits for Process Variability ..:

, In: 2019 17th IEEE International New Circuits and Systems Conference (NEWCAS),
Moraes, L. B. ; Zimpeck, A. L. ; Meinhardt, C.. - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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5

Mitigation of process variability effects using decoupling ..:

Zimpeck, A.L. ; Meinhardt, C. ; Artola, L....
Microelectronics Reliability.  100-101 (2019)  - p. 113446 , 2019
Link: https://doi.org/10.1016/..
 
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6

Gate mapping impact on variability robustness in FinFET tec..:

Brendler, L.H. ; Zimpeck, A.L. ; Meinhardt, C..
Microelectronics Reliability.  100-101 (2019)  - p. 113448 , 2019
Link: https://doi.org/10.1016/..
 
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7

Robustness and Minimum Energy-Oriented FinFET Design:

, In: 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC),
Moraes, L. B. ; Zimpeck, A. L. ; Meinhardt, C.. - p. 247-248 , 2019
Link: https://doi.org/10.1109/..
 
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8

Evaluation of variability using Schmitt trigger on full add..:

Moraes, L.B. ; Zimpeck, A.L. ; Meinhardt, C..
Microelectronics Reliability.  88-90 (2018)  - p. 116-121 , 2018
Link: https://doi.org/10.1016/..
 
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9

Impact of different transistor arrangements on gate variabi..:

Zimpeck, A.L. ; Meinhardt, C. ; Artola, L....
Microelectronics Reliability.  88-90 (2018)  - p. 111-115 , 2018
Link: https://doi.org/10.1016/..
 
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10

Permanent and single event transient faults reliability eva..:

Aguiar, Y.Q. de ; Zimpeck, A.L. ; Meinhardt, C..
Microelectronics Reliability.  64 (2016)  - p. 63-67 , 2016
Link: https://doi.org/10.1016/..
 
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11

Impact of PVT variability on 20 nm FinFET standard cells:

Zimpeck, A.L. ; Meinhardt, C. ; Reis, R.A.L.
Microelectronics Reliability.  55 (2015)  9-10 - p. 1379-1383 , 2015
Link: https://doi.org/10.1016/..
 
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12

Predictive evaluation of electrical characteristics of sub-..:

Meinhardt, C. ; Zimpeck, A.L. ; Reis, R.A.L.
Microelectronics Reliability.  54 (2014)  9-10 - p. 2319-2324 , 2014
Link: https://doi.org/10.1016/..
 
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13

Guest Editorial Special Issue on the IEEE Latin American Sy..:

Zimpeck, Alexandra ; Fish, Alexander
IEEE Transactions on Circuits and Systems I: Regular Papers.  71 (2024)  3 - p. 985-986 , 2024
Link: https://doi.org/10.1109/..
 
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14

An Approach to Remote Update Embedded Systems in the Intern..:

Peter, Cleber S. ; Penning, Lucas ; Zimpeck, Alexandra..
Journal of Internet Services and Applications.  14 (2023)  1 - p. 151-159 , 2023
Link: https://doi.org/10.5753/..
 
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15

Impact on Radiation Robustness of Gate Mapping in FinFET Ci..:

, In: 2023 IEEE International Symposium on Circuits and Systems (ISCAS),
Sandoval, Bernardo Borges ; Brendler, Leonardo H. ; Kastensmidt, Fernanda L.... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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