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2023 IEEE International Symposium on Circuits and Systems (ISCAS) ,
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Impact on Radiation Robustness of Gate Mapping in FinFET Ci..:
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2023 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI) ,
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A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM A..:
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2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS) ,
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Fast and Low-Error Prediction of Logic Gate Cell Characteri..:
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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs ,
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FinFET Technology:
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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs ,
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Reliability Challenges in FinFETs:
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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs ,
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Circuit-Level Mitigation Approaches:
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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs ,
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