E-LIB Suche - Ergebnisse für: Zongbei, Dai

1

Failure Analysis of Dielectric Material Defects Inside IGBT..:

, In: 2022 4th International Conference on System Reliability and Safety Engineering (SRSE),

Jian, Zhou ; Jiesen, Li ; Zongbei, Dai.. - p. 421-424 , 2022

Link: https://doi.org/10.1109/..

2

A novel machine learning-based imputation strategy for miss..:

Li, Yaqiu ; Zhou, Qijie ; Fan, Ye...
Heliyon. 10 (2024) 4 - p. e26429 , 2024

Link: https://doi.org/10.1016/..

3

Counter-intuitive mechanical performance variation in aged ..:

Li, Wangyun ; Mo, Lanqing ; Chen, Feng...
Vacuum. 227 (2024) - p. 113367 , 2024

Link: https://doi.org/10.1016/..

4

SiC IGBT degradation mechanism investigation under HV-H3TRB..:

Wu, Ziming ; Dai, Zongbei ; Zhou, Jian...
Journal of Power Electronics. 24 (2023) 2 - p. 305-315 , 2023

Link: https://doi.org/10.1007/..

5

Failure Analysis of Open Circuit for the LEDs of Epoxy Resi..:

, In: 2023 6th International Conference on Electronics Technology (ICET),

Peng, Bo ; Xu, Huangxiang ; Dai, Zongbei... - p. 391-395 , 2023

Link: https://doi.org/10.1109/..

6

Photoelectric characteristics of hydrogen-terminated polycr..:

Liu, Yuebo ; Dong, Xianshan ; Liao, Wenyuan...
Optics Express. 31 (2023) 18 - p. 29061 , 2023

Link: https://doi.org/10.1364/..

7

High Thermoelectric Performance Achieved in Sb-Doped GeTe b..:

Li, Chao ; Song, Haili ; Dai, Zongbei...
Materials. 15 (2022) 2 - p. 406 , 2022

Link: https://doi.org/10.3390/..

8

Vias electromigration lifetime reliability evaluation by us..:

, In: 2022 IEEE 24th Electronics Packaging Technology Conference (EPTC),

Wen, Zhang Xiao ; Ling, Lin Xiao ; Dai, Zongbei. - p. 833-836 , 2022

Link: https://doi.org/10.1109/..

9

The effect of cyclic thermal loading rate on the mechanical..:

, In: 2022 IEEE 24th Electronics Packaging Technology Conference (EPTC),

Bao, Hong ; Liu, Tianhan ; Ning, Minjie... - p. 114-118 , 2022

Link: https://doi.org/10.1109/..

10

Using data mining and root cause analysis method for failur..:

Wang, Hongjian ; Zhao, Zhenbo ; Dai, Zongbei..
IOP Conference Series: Materials Science and Engineering. 1043 (2021) 2 - p. 022024 , 2021

Link: https://doi.org/10.1088/..

11

Oxide at the Al-rich Fe0.85Al0.15(110) surface:

Dai, Zongbei ; Alyabyeva, Natalia ; Van den Bossche, Maxime...
Physical Review Materials. 4 (2020) 7 - p. , 2020

Link: https://doi.org/10.1103/..

12

Al-rich Fe0.85Al0.15(1 0 0), (1 1 0) and (1 1 1) surface st..:

Dai, Zongbei ; Alyabyeva, Natalia ; Borghetti, Patrizia...
Applied Surface Science. 509 (2020) - p. 145312 , 2020

Link: https://doi.org/10.1016/..

13

Combined methods for analyzing the nonvisual failures of a ..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),

Ni, Yiqiang ; Dai, Zongbei ; Chen, Xuanlong... - p. 1-5 , 2020

Link: https://doi.org/10.1109/..

14

Aluminium segregation profiles in the (110), (100) and (111..:

Dai, Zongbei ; Borghetti, Patrizia ; Chenot, Stéphane...
Applied Surface Science. 492 (2019) - p. 886-895 , 2019

Link: https://doi.org/10.1016/..

15

Self-organized carbon-rich stripe formation from competitiv..:

Dai, Zongbei ; Borghetti, Patrizia ; Mouchaal, Younes...
Applied Surface Science. 444 (2018) - p. 457-466 , 2018

Link: https://doi.org/10.1016/..