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de Aguiar, Y.Q
1331  Ergebnisse:
Personensuche X
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1

Characterization of Radiophotoluminescence Dosimeters under..:

Ferrari, M. ; Aguiar, Y. Q. ; Hasan, A....
IEEE Transactions on Nuclear Science.  , 2024
Link: https://doi.org/10.1109/..
 
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2

Design development and implementation of an irradiation sta..:

Ferrari, M. ; Senajova, D. ; Aberle, O....
Physical Review Accelerators and Beams.  25 (2022)  10 - p. , 2022
Link: https://doi.org/10.1103/..
 
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3

Single-Event Latchup sensitivity: Temperature effects and t..:

Guagliardo, S. ; Wrobel, F. ; Aguiar, Y.Q....
Microelectronics Reliability.  119 (2021)  - p. 114087 , 2021
Link: https://doi.org/10.1016/..
 
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4

Comparing analytical and Monte-Carlo-based simulation metho..:

Schvittz, R.B. ; Aguiar, Y.Q. ; Wrobel, F....
Microelectronics Reliability.  114 (2020)  - p. 113871 , 2020
Link: https://doi.org/10.1016/..
 
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5

Effect of Temperature on Single Event Latchup Sensitivity:

, In: 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS),
Guagliardo, S. ; Wrobel, F. ; Aguiar, Y. Q.... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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6

Design exploration of majority voter architectures based on..:

Aguiar, Y.Q. ; Wrobel, F. ; Autran, J.-L....
Microelectronics Reliability.  114 (2020)  - p. 113877 , 2020
Link: https://doi.org/10.1016/..
 
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7

Reliability-driven pin assignment optimization to improve i..:

Aguiar, Y.Q. ; Wrobel, F. ; Autran, J.-L....
Microelectronics Reliability.  114 (2020)  - p. 113885 , 2020
Link: https://doi.org/10.1016/..
 
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8

Radiation hardening efficiency of gate sizing and transisto..:

Aguiar, Y.Q. ; Wrobel, F. ; Guagliardo, S....
Microelectronics Reliability.  100-101 (2019)  - p. 113457 , 2019
Link: https://doi.org/10.1016/..
 
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9

Single Event Latchup Cross Section Calculation from TCAD Si..:

, In: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Guagliardo, S. ; Wrobel, F. ; Aguiar, Y.Q.... - p. 01-05 , 2019
Link: https://doi.org/10.1109/..
 
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10

Analysis of the charge sharing effect in the SET sensitivit..:

Aguiar, Y.Q. ; Wrobel, F. ; Autran, J.-L....
Microelectronics Reliability.  88-90 (2018)  - p. 920-924 , 2018
Link: https://doi.org/10.1016/..
 
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11

Evaluation of heavy-ion impact in bulk and FDSOI devices un..:

Calienes, W.E. ; de Aguiar, Y.Q. ; Meinhardt, C...
Microelectronics Reliability.  76-77 (2017)  - p. 655-659 , 2017
Link: https://doi.org/10.1016/..
 
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12

Evaluation of radiation-induced soft error in majority vote..:

de Aguiar, Y.Q. ; Artola, L. ; Hubert, G....
Microelectronics Reliability.  76-77 (2017)  - p. 660-664 , 2017
Link: https://doi.org/10.1016/..
 
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13

Permanent and single event transient faults reliability eva..:

Aguiar, Y.Q. de ; Zimpeck, A.L. ; Meinhardt, C..
Microelectronics Reliability.  64 (2016)  - p. 63-67 , 2016
Link: https://doi.org/10.1016/..
 
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14

Mitigation and Predictive Assessment of SET Immunity of Dig..:

Aguiar, Y.Q ; Wrobel, Frédéric ; Autran, Jean-Luc...
info:eu-repo/semantics/altIdentifier/doi/10.3390/aerospace7020012.  , 2020
Link: https://hal.umontpellier..
 
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15

Design exploration of majority voter architectures based on..:

Aguiar, Y.Q ; Wrobel, Frédéric ; Autran, J-L...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2020.113877.  , 2020
Link: https://hal.science/hal-..
 
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