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1

Electrically active defects induced by thermal oxidation an..:

Kumar, Piyush ; Bathen, Marianne ; id_orcid:0 000-0002-6269-3530...
info:eu-repo/semantics/altIdentifier/doi/10.1063/5.0205965. , 2024

Link: https://hdl.handle.net/2..

2

Radiation-Induced Effects in SiC Vertical Power MOSFETs Irr..:

Bonaldo, Stefano ; Martinella, Corinna ; Race, Salvatore...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2024.3366190. , 2024

Link: https://hdl.handle.net/2..

3

Impact of carbon injection in 4H-SiC on defect formation an..:

Bathen, Marianne ; id_orcid:0 000-0002-6269-3530 ; Karsthof, Robert...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.mssp.2024.108316. , 2024

Link: https://hdl.handle.net/2..

4

Al-implantation induced damage in 4H-SiC:

Kumar, Piyush ; Martins, Maria Inês Mendes ; Prokscha, Thomas..
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.mssp.2024.108241. , 2024

Link: https://hdl.handle.net/2..

5

Accelerated Evaluation of Quasi-Static Interaction Integral..:

Romano, Daniele ; Kovacevic-Badstuebner, Ivana ; id_orcid:0 000-0001-6960-2470...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TEMC.2024.3366985. , 2024

Link: https://hdl.handle.net/2..

6

Aluminum channeling in 4H-SiC by high-energy implantation a..:

Belanche Guadas, Manuel ; id_orcid:0 000-0002-1101-9554 ; Yonezawa, Yoshiyuki...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.mssp.2024.108461. , 2024

Link: https://hdl.handle.net/2..

7

Dual configuration of shallow acceptor levels in 4H-SiC:

Bathen, Marianne ; id_orcid:0 000-0002-6269-3530 ; Kumar, Piyush...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.mssp.2024.108360. , 2024

Link: https://hdl.handle.net/2..

8

Heavy-Ion-Induced Defects in Degraded SiC Power MOSFETs:

Martinella, Corinna ; Bathen, Marianne ; id_orcid:0 000-0002-6269-3530...
info:eu-repo/semantics/altIdentifier/doi/10.4028/p-3y3lv4. , 2023

Link: https://hdl.handle.net/2..

9

Temperature Dependence of the Channel and Drift Resistance ..:

Stark, Roger ; Tsibizov, Alexander ; Race, Salvatore...
info:eu-repo/semantics/altIdentifier/doi/10.4028/p-06b54k. , 2023

Link: https://hdl.handle.net/2..

10

DC-DC converters for the CMS MTD BTL and ECAL for HL-LHC:

Gadek, Tomasz ; Dissertori, Günther ; Grossner, Ulrike...
info:eu-repo/semantics/altIdentifier/doi/10.1088/1748-0221/18/02/C02038. , 2023

Link: https://hdl.handle.net/2..

11

Defect Profiling of Oxide-Semiconductor Interfaces Using Lo..:

Mendes Martins, Maria ; Kumar, Piyush ; Woerle, Judith...
info:eu-repo/semantics/altIdentifier/doi/10.1002/admi.202300209. , 2023

Link: https://hdl.handle.net/2..

12

Investigation of Electrically Active Defects in SiC Power D..:

Für, Natalija ; Belanche Guadas, Manuel ; id_orcid:0 000-0002-1101-9554...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2023.3242760. , 2023

Link: https://hdl.handle.net/2..

13

Mapping the impact of defect distributions in silicon carbi..:

Dorfer, Christian ; Bathen, Marianne ; id_orcid:0 000-0002-6269-3530...
info:eu-repo/semantics/altIdentifier/doi/10.1063/5.0142217. , 2023

Link: https://hdl.handle.net/2..

14

Energy-Dependent Impact of Proton Irradiation on 4H-SiC Sch..:

Kumar, Piyush ; Belanche Guadas, Manuel ; id_orcid:0 000-0002-1101-9554...
info:eu-repo/semantics/altIdentifier/doi/10.4028/p-0y444y. , 2023

Link: https://hdl.handle.net/2..

15

Small-Signal Impedance and Split CV Characterization of Hig..:

Race, Salvatore ; Kovacevic-Badstuebner, Ivana ; id_orcid:0 000-0001-6960-2470...
info:eu-repo/semantics/altIdentifier/doi/10.4028/p-2388hx. , 2023

Link: https://hdl.handle.net/2..

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