Stijnman, Peter R.S ;
Tokaya, Janot P ;
van Gemert, Jeroen...
Stijnman , P R S , Tokaya , J P , van Gemert , J , Luijten , P R , Pluim , J P W , Brink , W M , Remis , R F , van den Berg , C A T & Raaijmakers , A J E 2020 , ' Accelerating implant RF safety assessment using a low-rank inverse update method ' , Magnetic Resonance in Medicine , vol. 83 , no. 5 , pp. 1796-1809 . https://doi.org/10.1002/mrm.28023.
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2020