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1
Fundamentals of electromigration-aware integrated circuit d..:
Exemplar:
Zentrale:E02 a elt 607 e/586
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2
Robust design of microelectronics assemblies against mechan..
Woodhead publishing series in electronic and optical materials ; number 81
Exemplar:
Zentrale:Magazin 03.k.0521
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3
Circuit modeling for electromagnetic compatibility
EMC series;The SciTech series on electromagnetic compatibility
Exemplar:
Zentrale: a elt 890 e/145
?
4
High speed signaling
jitter modeling, analysis, and budgeting
Prentice Hall modern semiconductor design series
Exemplar:
Zentrale: a elt 942 m/168
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5
Process variations and probabilistic integrated circuit des..:
Exemplar:
Zentrale:E02 a elt 610.2 m/035
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6
Test- und Prüfverfahren in der Elektronikfertigung
vom Arbeitsprinzip bis Design-for-Test-Regeln
Exemplar:
Zentrale:E02 a elt 610.2 e/670
?
8
Reliability technology
principles and practice of failure prevention in electronic...
Wiley series in quality & reliability engineering
Exemplar:
Zentrale:E02 a elt 610.2 ef/872
?
9
Radiation effects in semiconductors
Devices, circuits, and systems
Exemplar:
Zentrale:E02 a elt 610.2 m/760
?
10
Soft errors in modern electronic systems
Frontiers in electronic testing ; 41
Exemplar:
Zentrale:E02 a elt 610.2 m/889
?
11
Failure analysis
a practical guide for manufacturers of electronic component...
Wiley series in quality and reliability engineering
Exemplar:
Zentrale:Magazin 03.k.0524
?
12
Dependability in electronic systems
mitigation of hardware failures, soft errors, and electro-m...
Exemplar:
Zentrale:E02 a elt 610.2 e/001
?
14
Designing electronic systems for EMC
The SciTech series on electromagnetic compatibility
Exemplar:
Zentrale: a elt 890 e/516
?
15
Qualitäts- und Zuverlässigkeitssicherung elektronischer B..
Methoden - Vorgehensweisen - Voraussagen ; mit 61 Tabellen
Kontakt + Studium ; 325, Elektrotechnik
Exemplare:
Zentrale:Magazin 03.j.4459; :TB Technik n 194/914(2)
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