27  Ergebnisse:
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1

Atomic force microscopy in process engineering 

introduction to AFM for improved processes and products  Butterworth-Heinemann IChemE series
Bowen, W. Richard ; Hilal, Nidal - 1. ed. . , c 2009
Exemplar:  Zentrale:E02 a ing 377.7 m/081
 
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2

Atomic force microscopy in process engineering 

introduction to AFM for improved processes and products  Butterworth-Heinemann;Butterworth-Heinemann/IChemE series
Bowen, W. Richard ; Hilal, Nidal - 1st ed . , 2009
 
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3

Scanning electron microscopy and X-ray microanalysis:

Goldstein, Joseph - Third Edition, corrected at the 6th printing . , [2007]
Exemplar:  Zentrale: a phy 384 e/806(3)
 
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4

Scanning microscopy for nanotechnology 

techniques and applications 
Exemplar:  Zentrale:E02 a ing 431.5 m/500
 
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6

Nanotribology and nanomechanics 

an introduction 
Exemplare:  Zentrale:E02 a nat 382.5/210; :TB Technik l 38/2222
 
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7

Scanning electron microscopy and X-ray microanalysis 

a text for biologists, materials scientists, and geologists 
Exemplar:  Zentrale: a phy 384 e/806(2)
 
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8

Cytochemical staining methods for electron microscopy 

Practical methods in electron microscopy ; 14
Exemplar:  Zentrale:Magazin 02.m.3911
 
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9

Elektronenmikroskopie 

erweiterte Einsatzmöglichkeiten durch neue Entwicklungen u...  Kontakt & Studium ; 112, Meß- und Prüftechnik
Exemplare:  Zentrale: a phy 384.5 m/882; TB BHV: phy 300/12
 
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12

Experimental high-resolution electron microscopy 

Monographs on the physics and chemistry of materials
Spence, John C. H. - 2. ed. . , 1988
Exemplar:  Zentrale:E02 a nat 382.5 e/421(2)
 
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13

Electron microscopy and analysis 1987 

proceedings of The Institute of Physics Electron Microscopy...  Conference series / Institute of Physics ; 90;Electron microscopy and analysis : proceedings of the Institute of Physics Electron Microscopy and Analysis Group ; 1987
Exemplar:  Zentrale: h phy 384 i/806-1987
 
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14

Electron microscopy and analysis 1985 

proceedings of The Institute of Physics Electron Microscopy...  Conference series / The Institute of Physics ; 78;Electron microscopy and analysis : proceedings of the Institute of Physics Electron Microscopy and Analysis Group ; 1985
Exemplar:  Zentrale: h phy 384 i/806-1985
 
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15

Experimental high-resolution electron microscopy 

Monographs on the physics and chemistry of materials
Exemplar:  Zentrale:Magazin 01.h.2735
 
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