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Nath, Suresh Kumar
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1

Depth Profiling of Ion Implanted Silicon by Electrical Meth..:

Dutt, M. B. ; Kumar, R. ; Nath, R...
physica status solidi (a).  96 (1986)  1 - p. 121-127 , 1986
Link: https://doi.org/10.1002/..
 
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2

Current–voltage characteristics of pure and iodine-doped ce..:

Kumar, A. ; Nath, R.
Physica Status Solidi (a).  61 (1980)  1 - p. 301-305 , 1980
Link: https://doi.org/10.1002/..
 
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3

Composition and Stability of the Chelate between Aluminium ..:

Srivastava, Suresh C. ; Sinha, Surendra Nath ; Dey, Arun K.
Journal f�r Praktische Chemie.  20 (1963)  1-2 - p. 70-80 , 1963
Link: https://doi.org/10.1002/..
 
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