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Massetti, A.P.
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Analysis of SiC Schottky diodes after thermal vacuum test b..:

, In: 2020 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
Vellvehi, M. ; Perpina, X. ; Avino, O.... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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Assessing Radiation Hardness of SIC MOS Structures:

, In: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Moreno, J. ; Cordero, E. ; Lopez, D.... - p. 1-8 , 2018
Link: https://doi.org/10.1109/..
 
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