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Compound Semiconductors 1997. Proceedings of the IEEE Twenty-Fourth International Symposium on Compound Semiconductors ,
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Structural and electrical characterization of epitaxial DyP..:
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LEOS '90. Conference Proceedings IEEE Lasers and Electro-Optics Society 1990 Annual Meeting ,
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Low threshold (//Sup </sub -//92 A/cm2) 1.6 /spl mu/m strai..:
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International Technical Digest on Electron Devices ,
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Low threshold and low internal loss 1.55- mu m strained-lay..:
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Proceedings of the 1988 ACM SIGMETRICS conference on Measurement and modeling of computer systems ,
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A manufacturing capacity planning experiment through functi..:
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2011 Abstracts IEEE International Conference on Plasma Science ,
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NX-3 plasma focus device: High flux pulsed neutron source:
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2007 IEEE 34th International Conference on Plasma Science (ICOPS) ,
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Effect of Anode Shapes on Neutron Emission from a Repetitiv..:
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2007 IEEE 34th International Conference on Plasma Science (ICOPS) ,
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Shadowgraphic and EUV Emission Studies of Low Energy Miniat..:
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2007 IEEE Particle Accelerator Conference (PAC) ,
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The fabrication and characterization of an S-band RF-gun ca..:
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49th European Conference on Optical Communications (ECOC 2023) ,
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Single-ended robotic arm pose sensor based on a multimode f..:
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2022 International Electron Devices Meeting (IEDM) ,
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Critical Process Features Enabling Aggressive Contacted Gat..:
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2016 IEEE International Geoscience and Remote Sensing Symposium (IGARSS) ,
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