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Olivo, Piero
26
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1
A Scalable Bidimensional Randomization Scheme for TLC 3D NA..:
Favalli, Michele
;
Zambelli, Cristian
;
Marelli, Alessia
..
Micromachines. 12 (2021) 7 - p. 759 , 2021
Link:
https://doi.org/10.3390/..
?
2
Assessing the Role of Program Suspend Operation in 3D NAND ..:
Zambelli, Cristian
;
Zuolo, Lorenzo
;
Aldarese, Antonio
...
Electronics. 10 (2021) 12 - p. 1394 , 2021
Link:
https://doi.org/10.3390/..
?
3
Mitigating Self-Heating in Solid State Drives for Industria..:
Zambelli, Cristian
;
Zuolo, Lorenzo
;
Crippa, Luca
..
Electronics. 9 (2020) 7 - p. 1179 , 2020
Link:
https://doi.org/10.3390/..
?
4
Characterization of the interface-driven 1st Reset operatio..:
Pérez, Eduardo
;
Mahadevaiah, Mamathamba Kalishettyhalli
;
Zambelli, Cristian
..
Solid-State Electronics. 159 (2019) - p. 51-56 , 2019
Link:
https://doi.org/10.1016/..
?
5
Impact of the precursor chemistry and process conditions on..:
Grossi, Alessandro
;
Perez, Eduardo
;
Zambelli, Cristian
...
Scientific Reports. 8 (2018) 1 - p. , 2018
Link:
https://doi.org/10.1038/..
?
6
Mechanism of the Key Impact of Residual Carbon Content on t..:
Niu, Gang
;
Cartoixà, Xavier
;
Grossi, Alessandro
...
The Journal of Physical Chemistry C. 121 (2017) 12 - p. 7005-7014 , 2017
Link:
https://doi.org/10.1021/..
?
7
Electrical characterization and modeling of 1T-1R RRAM arra..:
Grossi, Alessandro
;
Zambelli, Cristian
;
Olivo, Piero
...
Solid-State Electronics. 128 (2017) - p. 187-193 , 2017
Link:
https://doi.org/10.1016/..
?
8
Architectural and Integration Options for 3D NAND Flash Mem..:
Micheloni, Rino
;
Crippa, Luca
;
Zambelli, Cristian
.
Computers. 6 (2017) 3 - p. 27 , 2017
Link:
https://doi.org/10.3390/..
?
9
Electrical characterization and modeling of pulse-based for..:
Grossi, Alessandro
;
Zambelli, Cristian
;
Olivo, Piero
...
Solid-State Electronics. 115 (2016) - p. 17-25 , 2016
Link:
https://doi.org/10.1016/..
?
10
Performance and Reliability Analysis of Cross-Layer Optimiz..:
Bertozzi, Davide
;
Carlo, Stefano Di
;
Galfano, Salvatore
...
ACM Transactions on Embedded Computing Systems (TECS). 14 (2015) 1 - p. 1-24 , 2015
Link:
https://dl.acm.org/doi/1..
?
11
Performance and Reliability Analysis of Cross-Layer Optimiz..:
Bertozzi, Davide
;
Carlo, Stefano Di
;
Galfano, Salvatore
...
ACM Transactions on Embedded Computing Systems. 14 (2015) 1 - p. 1-24 , 2015
Link:
https://doi.org/10.1145/..
?
12
FLARES : An Aging Aware Algorithm to Autonomously Adapt ..:
Carlo, Stefano Di
;
Galfano, Salvatore
;
Indaco, Marco
...
ACM Transactions on Architecture and Code Optimization (TACO). 11 (2014) 3 - p. 1-25 , 2014
Link:
https://dl.acm.org/doi/1..
?
13
FLARES: An Aging Aware Algorithm to Autonomously Adapt the ..:
Carlo, Stefano Di
;
Galfano, Salvatore
;
Indaco, Marco
...
ACM Transactions on Architecture and Code Optimization. 11 (2014) 3 - p. 1-25 , 2014
Link:
https://doi.org/10.1145/..
?
14
Reliability of erasing operation in NOR-Flash memories:
Chimenton, Andrea
;
Olivo, Piero
Microelectronics Reliability. 45 (2005) 7-8 - p. 1094-1108 , 2005
Link:
https://doi.org/10.1016/..
?
15
Erratic Bits in Flash Memories under Fowler-Nordheim Progra..:
Chimenton, Andrea
;
Pellati, Paolo
;
Olivo, Piero
Japanese Journal of Applied Physics. 42 (2003) Part 1, No. 4B - p. 2041-2043 , 2003
Link:
https://doi.org/10.1143/..
1-15