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2023 IEEE International Reliability Physics Symposium (IRPS) ,
3
Effects of Collected Charge and Drain Area on SE Response o..:
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2022 IEEE International Reliability Physics Symposium (IRPS) ,
6
Soft Error Characterization of D-FFs at the 5-nm Bulk FinFE..:
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2022 IEEE International Reliability Physics Symposium (IRPS) ,
7
Single-Event Latchup Vulnerability at the 7-nm FinFET Node:
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2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
8
Micro-Latchup Location and Temperature Characterization in ..:
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2020 IEEE International Reliability Physics Symposium (IRPS) ,
10