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2021 International Conference on Mechanical, Aerospace and Automotive Engineering ,
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ON/OFF current of nano-node field-effect transistors on p-s..:
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202020 3rd IEEE International Conference on Knowledge Innovation and Invention (ICKII) ,
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Q-factor Integrity of 28nm-node High-k Gate Dielectric:
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202020 3rd IEEE International Conference on Knowledge Innovation and Invention (ICKII) ,
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Fringe Gate Leakage of 28nm HK/MG nMOSFETs with Nitridation..:
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2019 12th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics (CISP-BMEI) ,
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