Jeon, Sanghun
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1

Monolithically Integrated Complementary Ferroelectric FET X..:

Hwang, Junghyeon ; Joh, Hongrae ; Kim, Chaeheon..
ACS Applied Materials & Interfaces.  16 (2024)  2 - p. 2467-2476 , 2024
 
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4

Charge Trap Flash with Superior Program Efficiency by Negat..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Kim, Giuk ; Choi, Hyojun ; Lee, Sangho... - p. 1-2 , 2024
 
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5

Unlocking the Potential of Hafnia Ferroelectrics: Achieving..:

Yang, Ketong ; Jung, Minhyun ; Jung, Taeseung...
ACS Applied Electronic Materials.  6 (2024)  7 - p. 5067-5076 , 2024
 
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Novel Strategies Toward High-Performance FeFET for Computin..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Kim, Giuk ; Choi, Hyojun ; Lee, Sangho... - p. 1-2 , 2024
 
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8

Effect of Annealing Temperature on Minimum Domain Size of F..:

Yun, Seokjung ; Kim, Hoon ; Seo, Myungsoo...
ACS Applied Electronic Materials.  6 (2024)  4 - p. 2134-2141 , 2024
 
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10

Ultra-high Tunneling Electroresistance Ratio (2 × 104) & En..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
 
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11

Comprehensive Design Guidelines of Gate Stack for QLC and H..:

, In: 2023 International Electron Devices Meeting (IEDM),
Lim, Suhwan ; Kim, Taeyoung ; Myeong, Ilho... - p. 1-4 , 2023
 
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13

Development of MFMIS Gatestack with Thick Hafnium Zirconium..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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15

Three-terminal vertical ferroelectric synaptic barristor en..:

Jang, Seonghoon ; Kim, Yongjun ; Jeon, Jihoon...
Journal of Alloys and Compounds.  965 (2023)  - p. 171247 , 2023
 
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