Lampert, J
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9

Mitigating Impact of Defects On Performance with Classical ..:

, In: 2022 International Electron Devices Meeting (IEDM),
Kotlyar, R. ; Premaratne, S. ; Zheng, G.... - p. 8.4.1-8.4.4 , 2022
 
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12

Si MOS and Si/SiGe quantum well spin qubit platforms for sc..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Pillarisetty, R. ; Watson, T.F. ; Mueller, B.... - p. 14.1.1-14.1.4 , 2021
 
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14

High Volume Electrical Characterization of Semiconductor Qu..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Pillarisetty, R. ; Kashani, N. ; Keys, P.... - p. 31.5.1-31.5.4 , 2019
 
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15

Development of an open-source software package for watershe..:

Lampert, D.J. ; Wu, M.
Environmental Modelling & Software.  68 (2015)  - p. 166-174 , 2015
 
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