Nanver, Lis K.
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1

Identifying nano-Schottky diode currents in silicon diodes ..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),
Knezevic, Tihomir ; Nanver, Lis K - p. 1-6 , 2023
 
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5

Nanometer-thin pure boron CVD layers as material barrier to..:

Shivakumar, D. Thammaiah ; Knežević, Tihomir ; Nanver, Lis K.
Journal of Materials Science: Materials in Electronics.  32 (2021)  6 - p. 7123-7135 , 2021
 
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7

Impact of ultra-thin-layer material parameters on the suppr..:

, In: 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO),
 
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11

Restricted-Access Al-Mediated Material Transport in Al Cont..:

Sammak, Amir ; Qi, Lin ; Nanver, Lis K.
Journal of Electronic Materials.  44 (2015)  12 - p. 4676-4683 , 2015
 
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15

Low-Complexity Full-Melt Laser-Anneal Process for Fabricati..:

Biasotto, Cleber ; Gonda, Viktor ; Nanver, Lis K....
Journal of Electronic Materials.  40 (2011)  11 - p. 2187-2196 , 2011
 
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