Ohshima, T.
1086  results:
Search for persons X
?
 
?
 
?
 
?
7

Soft- and Hard-Error Radiation Reliability of 228 KB $3\mat..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Takahashi, H. ; Okamoto, Y. ; Hamada, T.... - p. 1-6 , 2023
 
?
 
?
15

Modified divacancies in 4H-SiC:

Son, N. T. ; Shafizadeh, D. ; Ohshima, T..
Journal of Applied Physics.  132 (2022)  2 - p. , 2022
 
1-15