Ota, Natsuki
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1

An Estimation Method of Defect Types Using Artificial Neura..:

, In: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
 
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13

Prognostic Implication of Histopathologic Indicators in Sal..:

Nakaguro, Masato ; Sato, Yukiko ; Tada, Yuichiro...
American Journal of Surgical Pathology.  44 (2019)  4 - p. 526-535 , 2019
 
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