Paz, Bruna Cardoso
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2

Electrical characterization and modeling of FDSOI MOSFETs f..:

, In: 2022 IEEE 15th Workshop on Low Temperature Electronics (WOLTE),
 
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4

Integrated Variability Measurements of 28 nm FDSOI MOSFETs ..:

, In: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS),
 
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Impact of substrate bias on the mobility of n-type ɷ-gate S..:

, In: 2019 34th Symposium on Microelectronics Technology and Devices (SBMicro),
 
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