E-LIB Suche - Ergebnisse für: Santi, Carlo De

1

Deep Level Effects in N-Polar AlGaN/GaN High Electron Mobil..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Saro, Marco ; de Pieri, Francesco ; Carlotto, Andrea... - p. 5B.2-1-5B.2-8 , 2024

Link: https://doi.org/10.1109/..

2

Optoelectronic technologies for lighting in automotive: sta..:

, In: 2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE),

Trivellin, Nicola ; Buffolo, Matteo ; De Santi, Carlo... - p. 1-6 , 2023

Link: https://doi.org/10.23919..

3

Modeling the electrical characteristic and degradation mech..:

, In: 2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD),

Roccato, Nicola ; Piva, Francesco ; De Santi, Carlo... - p. 81-83 , 2023

Link: https://doi.org/10.1109/..

4

On the importance of Fast and Accurate LED Optical and Ther..:

, In: 2023 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC),

Trivellin, Nicola ; Roccato, Nicola ; Piva, Francesco... - p. 1-5 , 2023

Link: https://doi.org/10.1109/..

5

Performance and Degradation of Commercial Ultraviolet‐C Lig..:

Trivellin, Nicola ; Piva, Francesco ; Fiorimonte, Davide...
physica status solidi (a). , 2023

Link: https://doi.org/10.1002/..

6

Solid State Lighting for horticolture: impact of LED reliab..:

, In: 2023 IEEE Sustainable Smart Lighting World Conference & Expo (LS18),

Trivellin, Nicola ; Buffolo, Matteo ; Caria, Alessandro... - p. 1-5 , 2023

Link: https://doi.org/10.1109/..

7

Modeling the electrical degradation of AlGaN-based UV-C LED..:

Roccato, Nicola ; Piva, Francesco ; De Santi, Carlo...
Applied Physics Letters. 122 (2023) 16 - p. , 2023

Link: https://doi.org/10.1063/..

8

A Review of SiC Commercial Devices for Automotive: Properti..:

, In: 2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE),

Marcuzzi, Alberto ; Favero, Davide ; Santi, Carlo De... - p. 1-6 , 2023

Link: https://doi.org/10.23919..

9

Gate leakage modeling in lateralβ-Ga2O3 MOSFETs with Al2O3 ..:

Fregolent, Manuel ; Brusaterra, Enrico ; De Santi, Carlo...
Applied Physics Letters. 123 (2023) 10 - p. , 2023

Link: https://doi.org/10.1063/..

10

Addressing the Optical Degradation of 1.3 μm Quantum Dot La..:

Zenari, Michele ; Buffolo, Matteo ; De Santi, Carlo...
ACS Photonics. 10 (2023) 12 - p. 4188-4195 , 2023

Link: https://doi.org/10.1021/..

11

Thermally-activated failure mechanisms of 0.25 \ \mu \mathr..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Gao, Zhan ; Chiocchetta, Francesca ; Rampazzo, Fabiana... - p. 1-5 , 2023

Link: https://doi.org/10.1109/..

12

Trapping in $\text{Al}_{2}\mathrm{O}_{3}/\text{GaN}$ MOScap..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Fregolent, Manuel ; Marcuzzi, Alberto ; De Santi, Carlo... - p. 1-5 , 2023

Link: https://doi.org/10.1109/..

13

Scaling of E-mode power GaN-HEMTs for low voltage/low Ron a..:

Benato, Andrea ; De Santi, Carlo ; Borga, Matteo...
Microelectronics Reliability. 150 (2023) - p. 115133 , 2023

Link: https://doi.org/10.1016/..

14

Defects and Reliability of GaN‐Based LEDs: Review and Persp..:

Buffolo, Matteo ; Caria, Alessandro ; Piva, Francesco...
physica status solidi (a). 219 (2022) 8 - p. , 2022

Link: https://doi.org/10.1002/..

15

Modeling the electrical characteristic of InGaN/GaN blue-vi..:

Roccato, Nicola ; Piva, Francesco ; De Santi, Carlo...
Microelectronics Reliability. 138 (2022) - p. 114724 , 2022

Link: https://doi.org/10.1016/..