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Sijbrandij, S. J.
174
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1
Imaging Contrast with Multiple Ion Beams – RETRACTION:
Wu, H
;
Sijbrandij, S
;
McVey, S
.
Microscopy and Microanalysis. 21 (2015) S3 - p. E4 , 2015
Link:
https://doi.org/10.1017/..
?
2
Towards SIMS on the Helium Ion Microscope: Detection Limits..:
Dowsett, D.
;
Pillatsch, L.
;
Vanhove, N.
...
Microscopy and Microanalysis. 19 (2013) S2 - p. 354-355 , 2013
Link:
https://doi.org/10.1017/..
?
3
Study and optimisation of SIMS performed with He+ and Ne+ b..:
Pillatsch, L.
;
Vanhove, N.
;
Dowsett, D.
...
Applied Surface Science. 282 (2013) - p. 908-913 , 2013
Link:
https://doi.org/10.1016/..
?
4
Towards secondary ion mass spectrometry on the helium ion m..:
Wirtz, T.
;
Vanhove, N.
;
Pillatsch, L.
...
Applied Physics Letters. 101 (2012) 4 - p. 041601 , 2012
Link:
https://doi.org/10.1063/..
?
5
Towards Secondary Ion Mass Spectrometry On The Helium Ion M..:
Wirtz, T.
;
Pillatsch, L.
;
Vanhove, N.
...
Microscopy and Microanalysis. 18 (2012) S2 - p. 812-813 , 2012
Link:
https://doi.org/10.1017/..
?
6
Advances in High Resolution Helium Ion Microscope (HIM) Ima..:
Sanford, C
;
Notte, J
;
Scipioni, L
...
Microscopy and Microanalysis. 15 (2009) S2 - p. 654-655 , 2009
Link:
https://doi.org/10.1017/..
?
7
A New Detector for Backscattered Helium Ions in the 30 keV ..:
Sijbrandij, S
;
Notte, J
;
Thompson, B
...
Microscopy and Microanalysis. 15 (2009) S2 - p. 220-221 , 2009
Link:
https://doi.org/10.1017/..
?
8
Performance of a microsphere plate electron multiplier in A..:
Sijbrandij, S.J
;
Miller, M.K
Ultramicroscopy. 79 (1999) 1-4 - p. 265-271 , 1999
Link:
https://doi.org/10.1016/..
?
9
A novel approach to gaseous field ion sources for focused i..:
Miller, M.K
;
Sijbrandij, S.J
Ultramicroscopy. 79 (1999) 1-4 - p. 225-230 , 1999
Link:
https://doi.org/10.1016/..
?
10
Atom probe analysis of nickel-based superalloy IN-718 with ..:
Sijbrandij, S.J
;
Miller, M.K
;
Horton, J.A
.
Materials Science and Engineering: A. 250 (1998) 1 - p. 115-119 , 1998
Link:
https://doi.org/10.1016/..
?
11
Performance of an energy-compensated three-dimensional atom..:
Cerezo, A.
;
Godfrey, T. J.
;
Sijbrandij, S. J.
..
Review of Scientific Instruments. 69 (1998) 1 - p. 49-58 , 1998
Link:
https://doi.org/10.1063/..
?
12
Digital Field Ion Microscopy:
Sijbrandij, S. J.
;
Russell, K. F.
;
Thomson, R. C.
.
Microscopy and Microanalysis. 4 (1998) S2 - p. 88-89 , 1998
Link:
https://doi.org/10.1017/..
?
13
Atom Probe Field Ion Microscopy of High Resistivity Materia..:
Sijbrandij, S. J.
;
Larson, D. J.
;
Miller, M. K.
Microscopy and Microanalysis. 4 (1998) S2 - p. 90-91 , 1998
Link:
https://doi.org/10.1017/..
?
14
Atomprobe analysis of initial decomposition of Fe-N martens..:
Genderen, M. J. van
;
Sijbrandij, S. J.
;
Böttger, A.
..
Materials Science and Technology. 13 (1997) 10 - p. 806-812 , 1997
Link:
https://doi.org/10.1179/..
?
15
Atomprobe analysis of initial decomposition of Fe-N martens..:
Genderen, M. J. van
;
Sijbrandij, S. J.
;
Böttger, A.
..
Materials Science and Technology. 13 (1997) 10 - p. 806-812 , 1997
Link:
https://doi.org/10.1179/..
1-15