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2023 IEEE International Reliability Physics Symposium (IRPS) ,
12
Depassivation of Traps in the Polysilicon Channel of 3D NAN..:
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2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ,
13
Understanding the impact of polysilicon percolative conduct..:
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2022 IEEE International Conference on Emerging Electronics (ICEE) ,
15