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2006 International Conference of the IEEE Engineering in Medicine and Biology Society ,
3
The Use of an `Effective Potential' to Describe the Directe..:
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2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) ,
7
Pattern Generation for Efficient Acceptability Verification..:
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2022 IEEE 31st Asian Test Symposium (ATS) ,
10
On No-Reference Error Detection of an Image Stitching Syste..:
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2020 IEEE International Test Conference in Asia (ITC-Asia) ,
12