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Thomas, Lionel
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Thermal-Electrical finite element analysis of nanometric co..:
Oviedo, Juan F
;
Trojman, Lionel
;
Kauerauf, Thomas
.
https://revistas.usfq.edu.ec/index.php/avances/article/view/139/141. , 2013
Link:
https://revistas.usfq.ed..
1-1
