Liu, Shih-Yao
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1

A new lot sentencing approach by variables inspection based..:

, In: International journal of production research / Institution of Production Engineers ; American Institute of Industrial Engineers ; Society of Manufacturing Engineers
Wu, Chien-wei ; Liu, Shih-Wen. (2018)  12 - p. 4087-4099
Copies: Zentrale;
 
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2

A quick switching sampling system by variables for controll..:

, In: International journal of production research / Institution of Production Engineers ; American Institute of Industrial Engineers ; Society of Manufacturing Engineers
Liu, Shih-Wen ; Wu, Chien-wei. (2016)  5/6 - p. 1839-1849
Copies: Zentrale;
 
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3

A rusubmitted sampling scheme by variables inspection for c..:

, In: International journal of production research / Institution of Production Engineers ; American Institute of Industrial Engineers ; Society of Manufacturing Engineers
Liu, Shih-wen ; Lin, Shi-woei. (2014)  12 - p. 3744-3754
Copies: Zentrale;
 
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4

Analysing semiconductor manufacturing big data for root cau..:

, In: International journal of production research / Institution of Production Engineers ; American Institute of Industrial Engineers ; Society of Manufacturing Engineers
Chien, Chen-Fu ; Liu, Chiao-Wen ; Chuang, Shih-Chung. (2017)  17/18 - p. 5095-5107
Copies: Zentrale;
 
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