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2024 IEEE International Reliability Physics Symposium (IRPS) ,
4
Effect of Off-State Stress on Data-Valid Window Margin for ..:
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2023 International Electron Devices Meeting (IEDM) ,
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Nanowell Field-Effect Transistors for Highly Sensitive Mole..:
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Proceedings of the conference on Design, automation and test in Europe ,
7
Optimized timed hardware software cosimulation without roll..:
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Proceedings of the 29th ACM/IEEE Design Automation Conference ,
8
HOPE: an efficient parallel fault simulator for synchronous..:
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1991 IEEE International Symposium on Circuits and Systems (ISCAS) ,
9
Quasi-static scheduling for multiprocessor DSP:
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Proceedings of the 26th ACM/IEEE Design Automation Conference ,
10
Test generation of stuck-open faults using stuck-at test se..:
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Lecture Notes in Mechanical Engineering; Modern Mechanics and Applications ,
11
A Study of Fluid-Structure Interaction of Unsteady Flow in ..:
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Medizintechnik Life Science Engineering ,
15