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Aoki, Kazumi
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1

Summing Node Test Method: Simultaneous Multiple AC Characte..:

, In: 2020 IEEE 29th Asian Test Symposium (ATS),
Ogihara, Gaku ; Nakatani, Takayuki ; Hatta, Akemi... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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2

Evaluation of Null Method for Operational Amplifier Short-T..:

, In: 2019 IEEE 13th International Conference on ASIC (ASICON),
Aoki, Riho ; Sato, Keno ; Ishida, Takashi... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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3

Accurate and Fast Testing Technique of Operational Amplifie..:

, In: 2019 IEEE International Test Conference in Asia (ITC-Asia),
Sasaki, Yuto ; Ichikawa, Tamotsu ; Kuwana, Anna... - p. 1-6 , 2019
Link: https://doi.org/10.1109/..
 
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