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Arai, Noriaki
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Electron Emission from HFC(100) Tip at Various Temperatures:

, In: 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC),
Kusunoki, Toshiaki ; Arai, Noriaki - p. 3-5 , 2023
Link: https://doi.org/10.1109/..
 
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Influence of External Gate Resistance on UIS Capability in ..:

, In: 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Honda, Masaaki ; Yamaji, Mizue ; Arai, Daisuke... - p. 335-338 , 2019
Link: https://doi.org/10.1109/..
 
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