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Bai, Changqing
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1

Design of a Low Temperature Drift Undervoltage Lockout Circ..:

, In: 2018 15th China International Forum on Solid State Lighting: International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS),
Guo, Weiling ; Du, Shuai ; Bai, Changqing.. - p. 1-4 , 2018
Link: https://doi.org/10.1109/..
 
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2

Exploring and Exploiting Uncertainty for Incomplete Multi-V..:

, In: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
Xie, Mengyao ; Han, Zongbo ; Zhang, Changqing.. - p. 19873-19882 , 2023
Link: https://doi.org/10.1109/..
 
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3

Breakdown Characteristics of Rod-Plate Electrode under Comp..:

, In: 2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE),
Li, Changqing ; Lu, Tiebing ; Zhang, Yuanhang.. - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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4

Influence of the Dielectric Film Height on the Charge Accum..:

, In: 2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE),
Bai, Bin ; Zhang, Yuanhang ; Li, Changqing.. - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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