Barbe, F
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1

Session 3 Device technology — Interconnects and contacts fo..:

, In: 1981 International Electron Devices Meeting,
Barbe, D.F. ; Brown, D.M. - p. 49 , 1981
 
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2

Session 25 Device technology — Process technology:

, In: 1981 International Electron Devices Meeting,
Antoniadis, D.A. ; Barbe, D.F. - p. 561 , 1981
 
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3

List of Contributors:

, In: Basic and Applied Bone Biology,
 
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4

Bone and the Brain:

, In: Basic and Applied Bone Biology,
Motyl, Katherine J. ; Barbe, Mary F. - p. 349-367 , 2019
 
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6

Contributors:

, In: Nerves and Nerve Injuries,
Abel, Naomi ; Agazzi, Siviero ; Ahmadian, Amir... - p. xxv-xxix , 2015
 
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7

Entrepreneurship Education at Mtech, University of Maryland:

, In: Advances in Educational Marketing, Administration, and Leadership; Academic Entrepreneurship and Technological Innovation,
Green, James V. ; Barbe, David F. - p. 75-99 , 2013
 
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9

8 Präoperative Evaluierung der Patienten:

, In: Tiefe Hirnstimulation,
Barbe, M. ; Maier, F. - p. 99-108 , 2017
 
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10

18 Lösungsvorschläge bei Problemen:

, In: Tiefe Hirnstimulation,
Barbe, M. ; Dafsari, H. S. ; Maier, F. - p. 172-180 , 2017
 
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11

List of Contributors:

, In: Flavour Science,
Acree, Terry E. ; Aguera, Evelyne ; Ahola, Johanna K.... - p. xix-xliv , 2014
 
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12

Impact of Mobility Boosters (XsSOI, CESL, TiN gate) on the ..:

, In: 2007 IEEE Symposium on VLSI Technology,
Andrieu, F. ; Aussenac, F. ; Feruglio, S.... - p. None , 2007
 
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13

25nm Short and Narrow Strained FDSOI with TiN/HfO2 Gate Sta..:

, In: 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers.,
Deleonibus, S. ; Mazure, C. ; Gaud, P.... - p. 134-135 , 2006
 
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14

Stress and Strain Measurement in Stressed Silicon Lines:

, In: Springer Proceedings in Physics; Microscopy of Semiconducting Materials 2007,
Béché, A ; Rouvière, J L ; Barbé, J C... - p. 419-422 ,
 
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15

Contributors:

, In: Clinical Respiratory Medicine,
Ahmed, Asia A. ; Albert, Richard K. ; Allen, Mark S.... - p. vii-xiv , 2012
 
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