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Beelen, Dietrich W.
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1

Estimating Failure Probabilities:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,
ter Maten, E. Jan W. ; Beelen, Theo G. J. ; Di Bucchianico, Alessandro... - p. 349-379 , 2019
Link: https://doi.org/10.1007/..
 
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2

Fast Fault Simulation for Detecting Erroneous Connections i..:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,
Dohmen, Jos J. ; Tasic, Bratislav ; Janssen, Rick... - p. 381-400 , 2019
Link: https://doi.org/10.1007/..
 
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3

Calibration of Probability Density Function:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,
Dohmen, Jos J. ; Beelen, Theo G. J. ; Dvortsova, Oryna... - p. 401-424 , 2019
Link: https://doi.org/10.1007/..
 
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4

An Unbiased Hybrid Importance Sampling Monte Carlo Approach..:

, In: Scientific Computing in Electrical Engineering; Mathematics in Industry,
Tyagi, Anuj Kumar ; Jonsson, Xavier ; Beelen, Theo. - p. 233-242 , 2020
Link: https://doi.org/10.1007/..
 
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5

Contributor contact details:

, In: Medical Robotics,
Gomes, Paula ; Vitiello, V. ; Kwok, K.-W.... - p. ix-xii , 2012
Link: https://doi.org/10.1016/..
 
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6

Southern blotting und PCR zum Nachweis minimal-residueller ..:

, In: Contributions to Oncology; Therapie der Leukämien und Lymphome unter besonderer Berücksichtigung der Zytokine,
Opalka, B. ; Diekmann, L. ; Beer, U.... - p. 130-141 , 1999
Link: https://doi.org/10.1159/..
 
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