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Bocquet, Franck
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A novel test structure with two active areas for eNVM relia..:

, In: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS),
Alkema, Khaled ; Melul, Franck ; Marca, Vincenzo Della... - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
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SuperCAST: a full free addressable memory array:

, In: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS),
Marca, Vincenzo Della ; Guilleau-Tavernier, Julien ; Laine, Pierre... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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