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Buggey, T. W.
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Short-term trap decay in a cryogenically irradiated charge-..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Buggey, T. W. ; Bush, N. ; Soman, M.... - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
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Experimental Study of the NIEL Scaling for Silicon Devices:

, In: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Nuns, T. ; Inguimbert, C. ; Soonckindt, S.... - p. 1-8 , 2018
Link: https://doi.org/10.1109/..
 
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