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Proceedings of the 15th conference on Winter Simulation - Volume 2 ,
1
Evaluation of a metric inventory system using simulation:
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2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ,
13
Advanced Metrology of Thick Silicon Nitride Films at 300 mm..:
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2023 IEEE Photonics Conference (IPC) ,
14
Compact Modeling of Key Passive Silicon Photonic Components..:
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2023 IEEE Photonics Conference (IPC) ,
15