Chang, Chih-Yi
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1

15.7 A 32Mb RRAM in a 12nm FinFet Technology with a 0.0249μ..:

, In: 2024 IEEE International Solid-State Circuits Conference (ISSCC),
Huang, Yi-Cheng ; Liu, Shang-Hsuan ; Chen, Hsu-Shun... - p. 288-290 , 2024
 
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2

Contributors:

, In: Principles of Multiple-Liquid Separation Systems,
 
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3

A Study of Monte Carlo Tree Search-Based Model for High Fre..:

, In: 2023 International Conference on Machine Learning and Cybernetics (ICMLC),
 
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4

Alcohol–salt interaction:

, In: Principles of Multiple-Liquid Separation Systems,
 
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5

A Closer Look at Geometric Temporal Dynamics for Face Anti-..:

, In: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW),
Chang, Chih-Jung ; Lee, Yaw-Chern ; Yao, Shih-Hsuan... - p. 1081-1091 , 2023
 
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6

D-Mode GaN HEMT with Direct Drive:

, In: 2023 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia),
 
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7

Investigation on ESD Robustness of 1200-V D- Mode GaN MIS-H..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
 
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8

Deep Learning based Refinement for Package Substrate Routin:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
Huang, Peng-Tai ; Koyama, Tsubasa ; Chang, Keng-Tuan... - p. 1871-1874 , 2023
 
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9

A 4.63pJ/b 112Gb/s DSP-Based PAM-4 Transceiver for a Large-..:

, In: 2023 IEEE International Solid- State Circuits Conference (ISSCC),
 
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10

Cascode GaN HEMT Gate Driving Analysis:

, In: 2023 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia),
 
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11

Vertically Stacked Ge Diamond-shape Nanowires GAAFET with F..:

, In: 2023 Silicon Nanoelectronics Workshop (SNW),
Chen, Bo-An ; Lin, Yi-Wen ; Chang, Hao-Hsiang... - p. 127-128 , 2023
 
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13

Investigation of HfO2/ZrO2 Superlattice Dielectric and High..:

, In: 2023 Silicon Nanoelectronics Workshop (SNW),
Huang, Ming-Yueh ; Yan, Siao-Cheng ; Zhong, Xin-Chan... - p. 125-126 , 2023
 
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14

Study of Ferroelectric HfO2-ZrO2 Superlattice Poly-Si Junct..:

, In: 2023 Silicon Nanoelectronics Workshop (SNW),
 
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15

Post-Etch Yield Killer Defects in 3D NAND High Aspect Ratio..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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