Chang, Chuan-Hsun
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1

Preliminary Study of Relationship between Health Behavior a..:

, In: 2019 IEEE 20th International Conference on Information Reuse and Integration for Data Science (IRI),
Chu, Kuo-Chung ; Xiao, Min-Yang ; Chang, Chuan-Hsun... - p. 410-413 , 2019
 
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2

Measuring the Importance of Smart E-learning education syst..:

, In: Proceedings of the 6th International Conference on Digital Technology in Education,
 
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3

ON/OFF current of nano-node field-effect transistors on p-s..:

, In: 2021 International Conference on Mechanical, Aerospace and Automotive Engineering,
Chou, Ching-Chuan ; Xu, Jia-Wei ; Song, Cheng-Zh... - p. 368-370 , 2021
 
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4

Prediction of Remaining Battery Life for Light Vehicles:

, In: 2022 IEEE 4th Eurasia Conference on IOT, Communication and Engineering (ECICE),
Hu, Nian-Ze ; Zeng, You-Xing ; Lin, Bo-An... - p. 532-534 , 2022
 
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5

A 28nm 1Mb Time-Domain Computing-in-Memory 6T-SRAM Macro wi..:

, In: 2022 IEEE International Solid- State Circuits Conference (ISSCC),
Wu, Ping-Chun ; Su, Jian-Wei ; Chung, Yen-Lin... - p. 1-3 , 2022
 
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6

Dye-Sensitized Solar Cell Using TiO2/ AgNWs Film: Applicati..:

, In: 2020 IEEE Eurasia Conference on IOT, Communication and Engineering (ECICE),
Lin, Yu-Che ; Chou, Jung-Chuan ; Lai, Chih-Hsien... - p. 353-354 , 2020
 
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7

Silicide formation at lower temperatures for cobalt and nic..:

, In: 2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers),
 
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8

A new method for emitting spin-polarized electron:

, In: 2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers),
 
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9

A Satcom On-the-Move Phased-Array Antenna Tracking Algorith..:

, In: 2023 23rd International Conference on Control, Automation and Systems (ICCAS),
Huang, Sheng-En ; Chang, Po-Hsun ; Lu, Xiu-Lin. - p. 1060-1065 , 2023
 
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10

Channel Surface Integrity with 2.4nm High-k Gate Dielectric..:

, In: 2021 9th International Symposium on Next Generation Electronics (ISNE),
 
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11

Integrity of n-type channel surface for nano-node high-k ga..:

, In: 2021 International Conference on Mechanical, Aerospace and Automotive Engineering,
Wang, Mu-Chun ; Shen, Yi-Chun ; Shen, Tien-Szu... - p. 363-367 , 2021
 
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12

Junction Integrity for 28nm High-k nMOSFETs with Thermal St..:

, In: 202020 3rd IEEE International Conference on Knowledge Innovation and Invention (ICKII),
Lin, Yu-Chen ; Zhan, Kai-Chun ; Zhang, Ji-Min... - p. 64-66 , 2020
 
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13

Dit Extraction of Nano-node HK/MG nMOSFETs Treated with DPN..:

, In: 2023 IEEE 3rd International Conference on Electronic Communications, Internet of Things and Big Data (ICEIB),
 
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