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Chen, Fengjia
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1

Detection of Electrical Defects by Distinguish Methodology ..:

, In: 2020 China Semiconductor Technology International Conference (CSTIC),
Chen, Shanshan ; Chen, Hunglin ; Long, Yin.. - p. 1-3 , 2020
Link: https://doi.org/10.1109/..
 
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2

Investigation and Discovery of the Integration of FEOL Proc..:

, In: 2020 China Semiconductor Technology International Conference (CSTIC),
Pan, Fengjia ; Chen, Hunglin ; Long, Yin.. - p. 1-3 , 2020
Link: https://doi.org/10.1109/..
 
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3

The Study and Investigation of Inline E-Beam Inspection for..:

, In: 2020 China Semiconductor Technology International Conference (CSTIC),
Long, Yin ; Yuan, Zengyi ; Pan, Fengjia.. - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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