Chen, Nan-Kuang
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1

High-Sensitivity Multicore-Fiber Strain Sensors Based on As..:

, In: 2022 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR),
Peng, Ya-Pei ; Suo, Lina ; Zhou, Haimiao... - p. 1-2 , 2022
 
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2

High Sensitivity Curvature Sensors Using Stretched Four-Cor..:

, In: 2022 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR),
Suo, Lina ; Peng, Ya-Pei ; Zhou, Haimiao.. - p. 1-2 , 2022
 
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3

Elongated Fiber Abrupt-Tapered Interferometers for High Sen..:

, In: 2022 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR),
Zhou, Haimiao ; Peng, Ya-Pei ; Suo, Lina... - p. 1-2 , 2022
 
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4

Molecule Self-Organized Fiber Grating in Fiber Few-Mode Int..:

, In: 2022 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR),
Peng, Ya-Pei ; Zhou, Haimiao ; Suo, Lina... - p. 1-2 , 2022
 
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5

Detection of the AKT Protein Using Supermode Interference M..:

, In: 2022 Asia Communications and Photonics Conference (ACP),
Tian, Zhen ; Hao, Shengyu ; Yuan, Jinhui... - p. 1956-1959 , 2022
 
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6

High sensitivity fiber refractive index sensor using tapere..:

, In: 2021 Opto-Electronics and Communications Conference (OECC),
Tian, Zhen ; Suo, Lina ; Chen, Nan-Kuang... - p. 1-3 , 2021
 
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7

Axial hexagonal evanescent fields in tapered multicore fibe..:

, In: 2020 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR),
Tian, Zhen ; Chen, Nan-Kuang ; Yan, Dong... - p. 1-2 , 2020
 
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8

New Scheme of Mode-Locked Laser by Broadband Cr-Doped Fiber..:

, In: 2019 24th OptoElectronics and Communications Conference (OECC) and 2019 International Conference on Photonics in Switching and Computing (PSC),
 
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9

A Case of Plasma-Induced Film Breakdown in 3D NAND BEOL Die..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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10

The Constraint Artificial-Intelligence Assisted Method for ..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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11

Post-Etch Yield Killer Defects in 3D NAND High Aspect Ratio..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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12

Common Source Line-to-Word Line Short Improvement by Elimin..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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13

Improvement of Twisting and Line-Edge Roughness of 3D NAND ..:

, In: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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14

Machine learning Assists on High Aspect Ratio Slit Trench E..:

, In: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Chang, Yu-Fan ; Lee, Hong-Ji ; Chou, Fu-Hsing... - p. 1-4 , 2022
 
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15

Study of Plasma Ash Rate Enhancement by Machine Learning Mo..:

, In: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Jheng, Shao-Lou ; Wu, Jyunhong ; Yang, Zusing... - p. 1-4 , 2021
 
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