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Chun-Kuei Liao
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1

High Performance Ge FinFET CMOS Invertor with $\mathrm{I}_{..:

, In: 2023 Silicon Nanoelectronics Workshop (SNW),
Wu, Cheng-Yu ; Ruan, Dun-Bao ; Chang-Liao, Kuei-Shu... - p. 23-24 , 2023
Link: https://doi.org/10.23919..
 
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2

Vth adjustable self-aligned embedded source/drain Si/Ge nan..:

, In: 2014 IEEE International Electron Devices Meeting,
Yang, Chih-Chao ; Shieh, Jia-Min ; Hsieh, Tung-Ying... - p. 16.3.1-16.3.4 , 2014
Link: https://doi.org/10.1109/..
 
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3

Ultralow EOT and high mobility Ge pMOSFETs with in-situ H2O..:

, In: 2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA),
Li-Jung Liu ; Kuei-Shu Chang-Liao ; Chung-Hao Fu... - p. 1-2 , 2013
Link: https://doi.org/10.1109/..
 
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4

Leakage effect suppression in charge pumping measurement an..:

, In: 2007 International Semiconductor Device Research Symposium,
Chun-Chang Lu ; Kuei-Shu Chang-Liao ; Chun-Yuan Lu.. - p. None , 2007
Link: https://doi.org/10.1109/..
 
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5

Process techniques and electrical characterization for high..:

, In: Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004.,
Kuei-Shu Chang-Liao ; Chun-Yuan Lu ; Chin-Lung Cheng. - p. 372,373,374,375,376,377 , 2004
Link: https://doi.org/10.1109/..
 
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6

Enhancing Recognition Accuracy of Urban Flooding by Generat..:

, In: 2022 IEEE International Conference on Consumer Electronics - Taiwan,
Chang, Kuei-Chung ; Liao, Yi-De ; Kuo, Chun-Yu - p. 357-358 , 2022
Link: https://doi.org/10.1109/..
 
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7

BEOL Compatible Extremely Scaled Bilayer ITO/IGZO Channel F..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Hooda, Sonu ; Lal, Manohar ; Chun-Kuei, Chen... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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8

Sub-10nm Ultra-thin ZnO Channel FET with Record-High 561 µA..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Chand, Umesh ; Sabry Aly, Mohamed M. ; Lal, Manohar... - p. 326-327 , 2022
Link: https://doi.org/10.1109/..
 
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9

Extremely- Scaled Channel Thickness ZnO FET with High Mobil..:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Chand, Umesh ; Chun-Kuei, Chen ; Lal, Manohar... - p. 256-258 , 2022
Link: https://doi.org/10.1109/..
 
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10

Are You Killing Time? Predicting Smartphone Users' Time-kil..:

, In: Proceedings of the 2023 CHI Conference on Human Factors in Computing Systems,
Chen, Yu-Chun ; Lee, Yu-Jen ; Kao, Kuei-Chun... - p. 1-19 , 2023
Link: https://dl.acm.org/doi/1..
 
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11

Back-End-of-Line-Compatible Anneal-Free Ferroelectric Field..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Tsai, Shih-Hao ; Li, Zhonghua ; Mo Ei Phyu, Ma Mo... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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12

Negative-U Defect Passivation in Oxide-Semiconductor by Cha..:

, In: 2023 International Electron Devices Meeting (IEDM),
Chen, Chun-Kuei ; Xu, Zefeng ; Hooda, Sonu... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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13

First Demonstration of HZO-LNOI Integrated Ferroelectric El..:

, In: 2023 International Electron Devices Meeting (IEDM),
Xu, Zefeng ; Chen, Chun-Kuei ; Lin, Hong-Lin... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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14

Overcoming Negative nFET VTH by Defect-Compensated Low-Ther..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Hooda, Sonu ; Chen, Chun-Kuei ; Lal, Manohar... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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15

Low-Thermal-Budget BEOL-Compatible Beyond-Silicon Transisto..:

, In: 2022 International Electron Devices Meeting (IEDM),
Thean, Aaron ; Tsai, Shih-Hao ; Chen, Chun-Kuei... - p. 12.2.1-12.2.4 , 2022
Link: https://doi.org/10.1109/..
 
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