Search for persons
X
?
Communications in Computer and Information Science; New Trends in Computer Technologies and Applications ,
1
STEM Education Meets HPC:
, In:
?
2019 IEEE Frontiers in Education Conference (FIE) ,
2
Applying an Innovative Blended Model to Develop Cross-Domai..:
, In:
?
Proceedings of the 7th Multidisciplinary in International Social Networks Conference and The 3rd International Conference on Economics, Management and Technology ,
3
Mining Personality Traits from Social Text Messages:
, In:
?
2019 IEEE 11th International Conference on Engineering Education (ICEED) ,
4
Developing a Curriculum Learning Map for Cultivating Cross-..:
, In:
?
2019 IEEE 11th International Conference on Engineering Education (ICEED) ,
5
Applying Blockchain Technology to Develop Cross-Domain Digi..:
, In:
?
2019 IEEE Photonics Conference (IPC) ,
6
Simulation Model of Oxide-Aperture Strain Quantum Well VCSE:
, In:
?
2019 IEEE International Conference on Engineering, Technology and Education (TALE) ,
7
AIGO: A comprehensive platform for cultivating AI talent us..:
, In:
?
2019 IEEE Symposium Series on Computational Intelligence (SSCI) ,
8
Application of Wearable Devices in Crime Scene Investigatio..:
, In:
?
2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) ,
9
Investigation of AIGaN/GaN MISHEMTs with Varied AIGaN Barri..:
, In:
?
2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT) ,
10
GaN on Si RF performance with different AlGaN back barrier:
, In:
?
2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT) ,
11
Effect of O2 plasma surface treatment on gate leakage curre..:
, In:
?
2022 International Electron Devices Meeting (IEDM) ,
12
Highly Reliable, Scalable, and High-Yield HfZrOx FRAM by Ba..:
, In:
?
2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ,
13
Area Scalable Hafnium-Zirconium-Oxide Ferroelectric Capacit..:
, In:
?
2021 IEEE International Electron Devices Meeting (IEDM) ,
14
Improving Edge Dead Domain and Endurance in Scaled HfZrOx F..:
, In:
?
2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ,
15