Chung, Hsin-Yeh
254  results:
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1

STEM Education Meets HPC:

, In: Communications in Computer and Information Science; New Trends in Computer Technologies and Applications,
Chou, Hsiu-Mei ; Norika, Sugita ; Hsin, Ching-Yeh. - p. 487-492 , 2022
 
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2

Applying an Innovative Blended Model to Develop Cross-Domai..:

, In: 2019 IEEE Frontiers in Education Conference (FIE),
Huang, Yu-Han ; Tu, Yi-Lien ; Wu, Hsin-Jung... - p. 1-5 , 2019
 
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3

Mining Personality Traits from Social Text Messages:

, In: Proceedings of the 7th Multidisciplinary in International Social Networks Conference and The 3rd International Conference on Economics, Management and Technology,
 
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4

Developing a Curriculum Learning Map for Cultivating Cross-..:

, In: 2019 IEEE 11th International Conference on Engineering Education (ICEED),
Tu, Yi-Lien ; Chen, Yi-Ching ; Wu, Hsin-Jung... - p. 210-215 , 2019
 
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5

Applying Blockchain Technology to Develop Cross-Domain Digi..:

, In: 2019 IEEE 11th International Conference on Engineering Education (ICEED),
Chen, Yi-Ching ; Wu, Hsin-Jung ; Wang, Chwen-Pyng... - p. 113-117 , 2019
 
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7

AIGO: A comprehensive platform for cultivating AI talent us..:

, In: 2019 IEEE International Conference on Engineering, Technology and Education (TALE),
 
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8

Application of Wearable Devices in Crime Scene Investigatio..:

, In: 2019 IEEE Symposium Series on Computational Intelligence (SSCI),
Lee, Cheng-Lung ; Fang, Yuan ; Huang, Yi-Hsin.. - p. 206-210 , 2019
 
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9

Investigation of AIGaN/GaN MISHEMTs with Varied AIGaN Barri..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Liu, An-Chen ; Chen, Hsin-Chu ; Tu, Po-Tsung... - p. 1-2 , 2024
 
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10

GaN on Si RF performance with different AlGaN back barrier:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Hsieh, Chang-Yan ; Chen, Hui-Yu ; Tu, Po-Tsung... - p. 1-2 , 2023
 
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11

Effect of O2 plasma surface treatment on gate leakage curre..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Liu, An-Chen ; Huang, Yu-Wen ; Lin, Chao-Hsu... - p. 1-2 , 2023
 
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12

Highly Reliable, Scalable, and High-Yield HfZrOx FRAM by Ba..:

, In: 2022 International Electron Devices Meeting (IEDM),
Lin, Yu-De ; Yeh, Po-Chun ; Dai, Jheng-Yang... - p. 32.1.1-32.1.4 , 2022
 
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13

Area Scalable Hafnium-Zirconium-Oxide Ferroelectric Capacit..:

, In: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
 
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14

Improving Edge Dead Domain and Endurance in Scaled HfZrOx F..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Lin, Yu-De ; Yeh, Po-Chun ; Tang, Ying-Tsan... - p. 6.4.1-6.4.4 , 2021
 
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15

CMOS-compatible GaN HEMT on 200mm Si-substrate for RF appli..:

, In: 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Yeh, Po-Chun ; Tu, Po-Tsung ; Liu, Hsueh-Hsing... - p. 1-2 , 2021
 
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