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Cong, You
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1

Analyzing the 3D Image Characteristics for a Pile of Hex Nu..:

, In: 2023 Sixth International Symposium on Computer, Consumer and Control (IS3C),
You, Sheng-Cong ; Peng, Cheng-Yu - p. 218-221 , 2023
Link: https://doi.org/10.1109/..
 
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2

Non-negative Sparse Laplacian regularized Latent Multi-view..:

, In: 2020 19th International Symposium on Distributed Computing and Applications for Business Engineering and Science (DCABES),
You, Cong-Zhe ; Fan, Hong-Hui ; Shu, Zhen-Qiu - p. 210-213 , 2020
Link: https://doi.org/10.1109/..
 
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3

A Generic Model for Multi-Dimensional Separation of Concern..:

, In: 2008 4th International Conference on Wireless Communications, Networking and Mobile Computing,
Zhang, Lin-Lin ; Ying, Shi ; Ni, You-Cong... - p. None , 2008
Link: https://doi.org/10.1109/..
 
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4

Enhancing Piano Practice Techniques: A Deep Learning System..:

, In: Proceedings of the 2024 International Conference on Innovation in Artificial Intelligence,
Chen, Yen-Chiu ; Lin, Cong-You ; Chiou, Yi-Cheng... - p. 78-85 , 2024
Link: https://dl.acm.org/doi/1..
 
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5

Research on Automatic Steering Control System of Full Hydra..:

, In: Computer and Computing Technologies in Agriculture XI; IFIP Advances in Information and Communication Technology,
Hu, Shupeng ; Fu, Weiqiang ; Li, You... - p. 517-528 , 2019
Link: https://doi.org/10.1007/..
 
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6

Optimum Optical Local Oscillator Power Levels Impact on Sig..:

, In: 2010 Symposium on Photonics and Optoelectronics,
Li, Yan-Chao ; Gao, Long ; Cong, Hai-Fang... - p. 1-3 , 2010
Link: https://doi.org/10.1109/..
 
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7

Improving the Continuity and Smoothness of the Compact Mode..:

, In: 2024 2nd International Symposium of Electronics Design Automation (ISEDA),
Wang, Wenbin ; Li, Cong ; Li, Haokun... - p. 54-58 , 2024
Link: https://doi.org/10.1109/..
 
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8

An Efficient Aged Timing Analysis Method for Digital Integr..:

, In: 2024 2nd International Symposium of Electronics Design Automation (ISEDA),
Zhang, Yang ; Tang, Zhengguang ; Jin, Yawei... - p. 474-479 , 2024
Link: https://doi.org/10.1109/..
 
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9

On Latent Defect Acceleration:

, In: 2024 2nd International Symposium of Electronics Design Automation (ISEDA),
Jin, Yawei ; Zhang, Yang ; Zhang, Hong... - p. 498-503 , 2024
Link: https://doi.org/10.1109/..
 
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10

AI Software Reliability: Concepts and Related Domains:

, In: 2023 2nd International Conference on Artificial Intelligence and Intelligent Information Processing (AIIIP),
Pan, Cong ; You, Jun ; Gao, Yan - p. 287-292 , 2023
Link: https://doi.org/10.1109/..
 
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11

Research on Mapping method for Electrical Parameters to Mod..:

, In: 2023 International Symposium of Electronics Design Automation (ISEDA),
Guo, Guangxin ; You, Hailong ; Li, Cong... - p. 405-408 , 2023
Link: https://doi.org/10.1109/..
 
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12

ASSURER : A PPA-friendly Security Closure Framework for ..:

, In: Proceedings of the 28th Asia and South Pacific Design Automation Conference,
Guo, Guangxin ; You, Hailong ; Tang, Zhengguang... - p. 504-509 , 2023
Link: https://dl.acm.org/doi/1..
 
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13

Survey on Reliability Engineering for AI Software Systems: ..:

, In: 2023 3rd International Symposium on Artificial Intelligence and Intelligent Manufacturing (AIIM),
Pan, Cong ; You, Jun ; Gao, Yan - p. 116-121 , 2023
Link: https://doi.org/10.1109/..
 
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14

XGBoost-based Survival Analysis in Business Risk Prediction:

, In: 2022 International Conference on High Performance Big Data and Intelligent Systems (HDIS),
Li, Ying-ying ; Xu, Zeng-min ; Feng, Cong. - p. 320-324 , 2022
Link: https://doi.org/10.1109/..
 
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15

Bias Temperature Instability Analysis of Nanosheet Based SR..:

, In: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Wang, Yun-Qi ; Li, Gao-Peng ; Li, Cong... - p. 1-3 , 2022
Link: https://doi.org/10.1109/..
 
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