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Deml, C.
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1

Gate-drain capacitance behaviour of the DMOS power transist..:

, In: PESC 98 Record. 29th Annual IEEE Power Electronics Specialists Conference (Cat. No.98CH36196),
Deml, C. ; Hoffmann, K. - p. 1716,1717,1718,1719 , 1998
Link: https://doi.org/10.1109/..
 
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2

Contributors:

, In: Epigenetics in Precision Medicine,
Barbé, Ferran ; Barney, Ryan C. ; Barrott, Jared... - p. xvii-xxii , 2022
Link: https://doi.org/10.1016/..
 
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3

Epigenetics in spine curvature disorders:

, In: Epigenetics in Precision Medicine,
Pérez-Machado, Gisselle ; Seco-Cervera, Marta ; Berenguer-Pascual, Ester... - p. 449-469 , 2022
Link: https://doi.org/10.1016/..
 
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4

No Complications in Switching from Recombinate to Advate — ..:

, In: 37th Hemophilia Symposium,
Bidlingmaier, C. ; Deml, M. M. ; Jenkins, S.. - p. 119-121 , 2008
Link: https://doi.org/10.1007/..
 
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